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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Optimized embedded memory diagnosis
Carvalho, M. de, Bernardi, P., Reorda, M. Sonza, Campanelli, N., Kerekes, T., Appello, D., Barone, M., Tancorre, V., Terzi, M.Year:
2011
Language:
english
DOI:
10.1109/ddecs.2011.5783109
File:
PDF, 1.53 MB
english, 2011