![](/img/cover-not-exists.png)
Fixed pattern noise in the solid-state imagers due to the striations in Czochralski silicon crystals
Senda, K., Hiroshima, Y., Matsumoto, S., Kuriyama, T., Susa, M., Terakawa, S., Kunii, T.Volume:
57
Year:
1985
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.334488
File:
PDF, 544 KB
english, 1985