[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Iddt testing of continuous-time filters
Arguelles, J., Lopez, M.J., Blanco, J., Martinez, M., Bracho, S.Year:
1995
Language:
english
DOI:
10.1109/vtest.1995.512624
File:
PDF, 517 KB
english, 1995