[IEEE 2007 65th Annual Device Research Conference - South...

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[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Feasibility Study of Composite Dielectric Tunnel Barriers for Flash Memory

Verma, Sarves, Pop, Eric, Kapur, Pawan, Majhi, Prashant, Parat, Krishna, Saraswat, Krishna C.
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Year:
2007
Language:
english
DOI:
10.1109/drc.2007.4373662
File:
PDF, 793 KB
english, 2007
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