Optical and electrical characterization of β-FeSi2 epitaxial thin films on silicon substrates
Lefki, K., Muret, P., Cherief, N., Cinti, R. C.Volume:
69
Year:
1991
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347720
File:
PDF, 950 KB
english, 1991