Characterization of thermally annealed tunnel junctions...

Characterization of thermally annealed tunnel junctions with preoxidized CoFe pinned electrode

Lee, J. H., Im, D. H., Yoon, C. S., Kim, C. K., Ando, Y., Kubota, H., Miyazaki, T.

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Volume:

Year:

2003

Language:

english

Journal:

Journal of Applied Physics

DOI:

10.1063/1.1628827

File:

PDF, 416 KB

english, 2003

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