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studied by resonant soft x-ray diffraction
Fink, Jörg, Schierle, Enrico, Weschke, Eugen, Geck, Jochen, Hawthorn, David, Soltwisch, Viktor, Wadati, Hiroki, Wu, Hsueh-Hung, Dürr, Hermann A., Wizent, Nadja, Büchner, Bernd, Sawatzky, George A.Volume:
79
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.79.100502
Date:
March, 2009
File:
PDF, 435 KB
english, 2009