Critical layer thickness in metal organic chemical vapor...

Journal of Applied Physics 1995 Vol. 78; Iss. 9

Critical layer thickness in metal organic chemical vapor deposition grown InGaAs/GaAs strained quantum wells

Zhang, Xiaobo, Briot, Olivier, Gil, Bernard, Aulombard, Roger
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Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360695
File:
PDF, 540 KB
english, 1995
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