Characterization of gadolinium and lanthanum oxide films on...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2002 Vol. 20; Iss. 3

Characterization of gadolinium and lanthanum oxide films on Si (100)

Wu, X., Landheer, D., Sproule, G. I., Quance, T., Graham, M. J., Botton, G. A.
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Volume:
20
Year:
2002
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1463079
File:
PDF, 839 KB
english, 2002
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