[IEEE 2012 25th International Conference on VLSI Design -...

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[IEEE 2012 25th International Conference on VLSI Design - Hyderabad, India (2012.01.7-2012.01.11)] 2012 25th International Conference on VLSI Design - Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias

Gupta, Breeta Sen, Ingelsson, Urban, Larsson, Erik
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Year:
2012
Language:
english
DOI:
10.1109/vlsid.2012.111
File:
PDF, 192 KB
english, 2012
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