![](/img/cover-not-exists.png)
[IEEE 2012 25th International Conference on VLSI Design - Hyderabad, India (2012.01.7-2012.01.11)] 2012 25th International Conference on VLSI Design - Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias
Gupta, Breeta Sen, Ingelsson, Urban, Larsson, ErikYear:
2012
Language:
english
DOI:
10.1109/vlsid.2012.111
File:
PDF, 192 KB
english, 2012