[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - Microwave intermodulation technique for monitoring the mechanical stress in RF MEMS capacitive switches
Palego, Cristiano, Hadler, Subrata, Baloglu, Bora, Peng, Zhen, Hwang, James C. M., Nied, Herman F., Forehand, David I., Goldsmith, Charles L.Year:
2008
Language:
english
DOI:
10.1109/mwsym.2008.4633095
File:
PDF, 442 KB
english, 2008