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[IEEE 2006 International Symposium on VLSI Technology, Systems, and Applications - Hsinchu, Taiwan (2006.4.24-2006.4.24)] 2006 International Symposium on VLSI Technology, Systems, and Applications - Resistance Increase in Metal Nano-wires
Chen, Hsueh-chung, Chen, Hsien-wei, Jeng, Shin-puu, Wu, Chii-ming, Sun, JackYear:
2006
Language:
english
DOI:
10.1109/vtsa.2006.251097
File:
PDF, 2.05 MB
english, 2006