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Bias-controlled friction of InAs nanowires on a silicon nitride layer studied by atomic force microscopy
Conache, G., Ribayrol, A., Fröberg, L. E., Borgström, M. T., Samuelson, L., Montelius, L., Pettersson, H., Gray, S. M.Volume:
82
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.82.035403
Date:
July, 2010
File:
PDF, 158 KB
english, 2010