[IEEE 2014 IEEE International Reliability Physics Symposium...

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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Soft error rate comparison of various hardened and non-hardened flip-flops at 28-nm node

Gaspard, N., Jagannathan, S., Diggins, Z. J., Mahatme, N. N., Loveless, T. D., Bhuva, B. L., Massengill, L. W., Holman, W. T., Narasimham, B., Oates, A., Marcoux, P., Tam, N., Vilchis, M., Wen, S.-J.,
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Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861177
File:
PDF, 264 KB
english, 2014
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