[IEEE 1979 Ultrasonics Symposium - (1979.09.26-1979.09.28)] 1979 Ultrasonics Symposium - Extraction of Low-Freuuency Properties from Scattering Mesaurements
Richardson, J.M., Elsley, R.K.Year:
1979
Language:
english
DOI:
10.1109/ultsym.1979.197216
File:
PDF, 438 KB
english, 1979