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Long-term NBTI degradation under real-use conditions in IBM...

Microelectronics Reliability 2014 / 11 Vol. 54; Iss. 11

Long-term NBTI degradation under real-use conditions in IBM microprocessors

Lu, Pong-Fei, Jenkins, Keith A., Webel, Tobias, Marquardt, Oliver, Schubert, Birgit
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.06.016
Date:
November, 2014
File:
PDF, 1.60 MB
english, 2014
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