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Electron diffraction and high-resolution transmission electron microscopy of the high temperature crystal structures of Ge[sub x]Sb[sub 2]Te[sub 3+x] (x=1,2,3) phase change material
Kooi, B. J., De Hosson, J. Th. M.Volume:
92
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1502915
File:
PDF, 903 KB
english, 2002