Interface roughening of Ge δ layers on Si(111)

Physical Review B 1995 / 3 Vol. 51; Iss. 12

Interface roughening of Ge δ layers on Si(111)

Falta, J., Gog, T., Materlik, G., Müller, B. H., Horn-von Hoegen, M.
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Volume:
51
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.51.7598
Date:
March, 1995
File:
PDF, 382 KB
english, 1995
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