Large On-Current Enhancement in Hetero-Junction Tunnel-FETs...

IEEE Electron Device Letters 2014 / 02 Vol. 35; Iss. 2

Large On-Current Enhancement in Hetero-Junction Tunnel-FETs via Molar Fraction Grading

Brocard, Sylvan, Pala, Marco G., Esseni, David
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2295884
Date:
February, 2014
File:
PDF, 486 KB
english, 2014
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