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Thermal stability of amorphous InGaZnO thin film transistors passivated by AlOx layers
Hu, Zhe, Zhou, Daxiang, Xu, Ling, Wu, Qi, Xie, Haiting, Dong, ChengyuanVolume:
104
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.10.012
Date:
February, 2015
File:
PDF, 1.10 MB
english, 2015