[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Metrology method for EVM based on waveform design
Zhou, Feng, Zhang, Rui, Rao, Anlei, Dan, Mu, Kai, Cheng, Gao, You-gangYear:
2014
Language:
english
DOI:
10.1109/cpem.2014.6898398
File:
PDF, 413 KB
english, 2014