Wave-dispersive x-ray spectrometer for simultaneous acquisition of several characteristic lines based on strongly and accurately shaped Ge crystal
Hayashi, Kouichi, Nakajima, Kazuo, Fujiwara, Kozo, Nishikata, SusumuVolume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2898406
File:
PDF, 643 KB
english, 2008