XPS investigation of impurities containing boron films...

Journal of Nuclear Materials 2015 / 02 Vol. 457

XPS investigation of impurities containing boron films affected by energetic deuterium implantation and thermal desorption

Shao, Dadong, Li, Jiaxing, Tan, Xiaoli, Yang, Zhongshi, Okuno, Kenji, Oya, Yasuhisa
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Volume:
457
Language:
english
Journal:
Journal of Nuclear Materials
DOI:
10.1016/j.jnucmat.2014.10.097
Date:
February, 2015
File:
PDF, 1.46 MB
english, 2015
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