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Charging and heating effects in a system of coupled single-electron tunneling devices
Krupenin, V. A., Lotkhov, S. V., Scherer, H., Weimann, Th., Zorin, A. B., Ahlers, F.-J., Niemeyer, J., Wolf, H.Volume:
59
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.59.10778
Date:
April, 1999
File:
PDF, 341 KB
english, 1999