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Experimental results of photothermal microstructural depth profiling
Lan, T. T. N., Seidel, U., Walther, H. G., Goch, G., Schmitz, B.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359869
File:
PDF, 800 KB
english, 1995