:Si(111) interface by x-ray standing-wave analysis

Physical Review B 1987 / 9 Vol. 36; Iss. 9

:Si(111) interface by x-ray standing-wave analysis

Fischer, A. E. M. J., Vlieg, E., van der Veen, J. F., Clausnitzer, M., Materlik, G.
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Volume:
36
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.36.4769
Date:
September, 1987
File:
PDF, 348 KB
english, 1987
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