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Silicide phase formation in Ni∕Si system: Depth-resolved positron annihilation and Rutherford backscattering study
Abhaya, S., Amarendra, G., Panigrahi, B. K., Nair, K. G. M.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2168296
File:
PDF, 333 KB
english, 2006