[IEEE 1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. - Hong Kong (6-10 Nov. 1995)] 1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings - Dependence of deep submicron CMOSFET characteristics on shallow source/drain junction depth
Kwang Myoung Rho,, Yo Hwan Koh,, Chan Kwang Park,, Seong Min Hwang,, Ha Poong Chung,, Myoung Jun Chung,, Dai Hoon Lee,Year:
1995
Language:
english
DOI:
10.1109/tencon.1995.496397
File:
PDF, 351 KB
english, 1995