Hydrogen in Si(100)–SiO[sub 2]–HfO[sub 2] gate stacks: Relevant charge states and their location
Godet, Julien, Broqvist, Peter, Pasquarello, AlfredoVolume:
91
Year:
2007
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2828027
File:
PDF, 543 KB
english, 2007