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-edge x-ray absorption fine structure study of growth and morphology of ultrathin nickel films deposited on copper
Nietubyć, Robert, Föhlisch, Alexander, Glaser, Leif, Lau, Julian Tobias, Martins, Michael, Reif, Matthias, Wurth, WilfriedVolume:
70
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.70.235414
Date:
December, 2004
File:
PDF, 182 KB
english, 2004