Microstructure of thermally grown and deposited alumina...

Physical Review B 1999 / 3 Vol. 59; Iss. 10

Microstructure of thermally grown and deposited alumina films probed with positrons

Somieski, Bertram, Hulett, Lester D., Xu, Jun, Pint, Bruce A., Tortorelli, Peter F., Nielsen, Bent, Asoka-Kumar, Palakkal, Suzuki, Ryoichi, Ohdaira, Toshiyuki
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Volume:
59
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.59.6675
Date:
March, 1999
File:
PDF, 462 KB
english, 1999
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