Evolution of Residual Stress and Structure in YSZ/SiO...

Chinese Physics Letters 2013 / 02 Vol. 30; Iss. 2

Evolution of Residual Stress and Structure in YSZ/SiO 2 Multilayers with Different Modulation Ratios

Xiao, Qi-Ling, Hu, Guo-Hang, He, Hong-Bo, Shao, Jian-Da
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Volume:
30
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/30/2/024206
Date:
February, 2013
File:
PDF, 478 KB
english, 2013
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