Polarized X-ray Fluorescence as a Probe of Ground State...

Physical Review Letters 1996 / 8 Vol. 77; Iss. 8

Polarized X-ray Fluorescence as a Probe of Ground State Properties

van Veenendaal, Michel, Goedkoop, J. B., Thole, B. T.
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Volume:
77
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.77.1508
Date:
August, 1996
File:
PDF, 190 KB
english, 1996
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