In situ characterization of epitaxially grown...

Physical Review B 1996 / 4 Vol. 53; Iss. 15

In situ characterization of epitaxially grown thin layers

Mitura, Z., Mazurek, P., Paprocki, K., Mikol/ajczak, P., Beeby, J. L.
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Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.10200
Date:
April, 1996
File:
PDF, 164 KB
english, 1996
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