Stability of the inelastic mean free paths determined by...

Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon

Jiricek, P., Zemek, J., Lejček, P., Lesiak, B., Jablonski, A., Čerňanský, M.
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Volume:
20
Year:
2002
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1450587
File:
PDF, 387 KB
english, 2002
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