Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
Jiricek, P., Zemek, J., Lejček, P., Lesiak, B., Jablonski, A., Čerňanský, M.Volume:
20
Year:
2002
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1450587
File:
PDF, 387 KB
english, 2002