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First-principles study of the atomic-scale structure of clean silicon tips in dynamic force microscopy
Caciuc, V., Hölscher, H., Blügel, S., Fuchs, H.Volume:
74
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.74.165318
Date:
October, 2006
File:
PDF, 669 KB
english, 2006