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An MBE growth facility for real-time in situ synchrotron x-ray topography studies of strained-layer III–V epitaxial materials
Whitehouse, C. R., Barnett, S. J., Soley, D. E. J., Quarrell, J., Aldridge, S. J., Cullis, A. G., Emeny, M. T., Johnson, A. D., Clarke, G. F., Lamb, W., Tanner, B. K., Cottrell, S., Lunn, B., Hogg, C.Volume:
63
Year:
1992
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1142675
File:
PDF, 1022 KB
english, 1992