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Characterization of Ca1−xErxF2+x solid solution thin films grown on Si(100) substrates
Barrière, A. S., Mombelli, B., Porté, B., Raoux, S., Guégan, H., Réau, M., L’Haridon, H., Moutonnet, D.Volume:
73
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.353284
File:
PDF, 1.00 MB
english, 1993