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Process-induced and gold acceptor defects in silicon
Mesli, A., Courcelle, E., Zundel, T., Siffert, P.Volume:
36
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.36.8049
Date:
November, 1987
File:
PDF, 768 KB
english, 1987