Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization
Brodusch, Nicolas, Demers, Hendrix, Trudeau, Michel, Gauvin, RaynaldVolume:
35
Language:
english
Journal:
Scanning
DOI:
10.1002/sca.21078
Date:
November, 2013
File:
PDF, 2.45 MB
english, 2013