Carrier temperature relaxation probed by femtosecond...

Journal of Applied Physics 1992 Vol. 72; Iss. 11

Carrier temperature relaxation probed by femtosecond transient grating experiments in CdSxSe1−x semiconductors

Lap, Dao van, Peschel, U., Ponath, H. E., Rudolph, W.
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Volume:
72
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.351980
File:
PDF, 1.03 MB
english, 1992
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