In situ TEM study of fractal formation in...

Physical Review B 1999 / 8 Vol. 60; Iss. 8

In situ TEM study of fractal formation in amorphous Ge/Au bilayer films

Zhang, Shuyuan, Wang, Xiaoping, Chen, Zhiwen, Wu, Ziqin, Jin-Phillipp, N. Y., Kelsch, M., Phillipp, F.
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Volume:
60
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.60.5904
Date:
August, 1999
File:
PDF, 807 KB
english, 1999
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