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Single-spin measurement using single-electron transistors to probe two-electron systems
Kane, B. E., McAlpine, N. S., Dzurak, A. S., Clark, R. G., Milburn, G. J., Sun, He Bi, Wiseman, HowardVolume:
61
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.61.2961
Date:
January, 2000
File:
PDF, 172 KB
english, 2000