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Structure of ultrathin SiO[sub 2]/Si(111) interfaces studied by photoelectron spectroscopy
Keister, J. W., Rowe, J. E., Kolodziej, J. J., Niimi, H., Tao, H.-S., Madey, T. E., Lucovsky, G.Volume:
17
Year:
1999
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.581805
File:
PDF, 437 KB
english, 1999