Current-induced energy barrier suppression for electromigration from first principles
Zhang, Ruoxing, Rungger, Ivan, Sanvito, Stefano, Hou, ShiminVolume:
84
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.84.085445
Date:
August, 2011
File:
PDF, 1.36 MB
english, 2011