![](/img/cover-not-exists.png)
Improved Fourier method of thickness determination by x-ray reflectivity
de Peralta, L. Grave, Temkin, H.Volume:
93
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1536722
File:
PDF, 286 KB
english, 2003