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[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Model-based calibration for battery characterization in HEV applications
Yiran Hu,, Yurkovich, Stephen, Guezennec, Yann, Bornatico, RaffaeleYear:
2008
Language:
english
DOI:
10.1109/acc.2008.4586510
File:
PDF, 784 KB
english, 2008