![](/img/cover-not-exists.png)
Investigation of Inversion Capacitance–Voltage Reconstruction for Metal Oxide Semiconductor Field Effect Transistors with Leaky Dielectrics using BSIM4/SPICE and Intrinsic Input Resistance Model
Lee, Wei, Su, Pin, Su, Ke-Wei, Chiang, Chung-Shi, Liu, SallyVolume:
46
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.46.1870
Date:
April, 2007
File:
PDF, 205 KB
english, 2007