Nuclear-magnetic-resonance characterization of the defect migrating during stage III in electron-irradiated copper
Minier, C., Minier, M., Andreani, R.Volume:
22
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.22.28
Date:
July, 1980
File:
PDF, 140 KB
english, 1980