Time-of-flight secondary ion mass spectrometry chemical...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2006 Vol. 24; Iss. 4

Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling

Lee, Tae Geol, Shon, Hyun Kyong, Lee, Kyung-Bok, Kim, Jinmo, Choi, Insung S., Moon, Dae Won
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Volume:
24
Year:
2006
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.2206191
File:
PDF, 978 KB
english, 2006
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